Sample Preparation for Transmission Electron Microscopy of Germanium
- 1 August 1961
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 32 (8), 889-891
- https://doi.org/10.1063/1.1717551
Abstract
Bulk samples of germanium have been reduced to sections thin enough for transmission electron microscopy. The apparatus and techniques of this virtual‐electrode electrolytic etching process are described in detail with emphasis on the geometric control obtained. An example is given of an electron transmission micrograph of a 500‐A‐thick section.Keywords
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