Depth selection by means of scattered electrons: A method to determine electron line profiles
- 1 May 1973
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 108 (3), 439-443
- https://doi.org/10.1016/0029-554x(73)90522-3
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Electron scattering effects in directional correlationsNuclear Instruments and Methods, 1973
- An analysis of backscatter Mössbauer spectra obtained with internal conversion electronsNuclear Instruments and Methods, 1972
- A NEW METHOD FOR MEASURING THE DEPTHS OF EMBEDDED RADIOTRACER ATOMS USING A PRECISION β-RAY SPECTROMETERCanadian Journal of Physics, 1963