Measurement of magnetostriction coefficients of epitaxial garnet films
- 1 September 1979
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 50 (9), 1130-1132
- https://doi.org/10.1063/1.1135999
Abstract
A technique for measuring the magnetostriction coefficients of epitaxial garnet films on 50-mm-diam wafers is described. The measurement is based on the shift of the microwave ferrimagnetic resonance produced by stressing the film, which is achieved by supporting the wafer around its circumference and reducing the atmospheric pressure on one side. A simple, nonresonant transmission microwave spectrometer which is well suited for measurements on large wafers is also described.Keywords
This publication has 7 references indexed in Scilit:
- Design and development of single-layer, ion-implantable small bubble materials for magnetic bubble devicesJournal of Applied Physics, 1979
- Magnetostriction constants of epitaxial La, Ga: YIG films measured by microwave resonanceApplied Physics A, 1977
- Ferrimagnetic Resonance Measurement of the λ111 Magnetostriction Constant with the Magnetic Field Along a 〈111〉 AxisJournal of Applied Physics, 1970
- A Ferromagnetic Resonance Method of Measuring Magnetostriction ConstantsReview of Scientific Instruments, 1968
- Magnetostriction Constants of Rare Earth Iron GarnetsJournal of the Physics Society Japan, 1967
- THE MAGNETOSTRICTION OF SILICON-DOPED YTTRIUM IRON GARNET (YIG)Applied Physics Letters, 1966
- Magnetostriction in Cubic Néel Ferrimagnets, with Application to YIGPhysical Review B, 1963