Flip-flop resolving time test circuit
- 1 August 1982
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 17 (4), 731-738
- https://doi.org/10.1109/jssc.1982.1051804
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- The behaviour of flip-flops used as synchronizers and prediction of their failure rateIEEE Journal of Solid-State Circuits, 1980
- Anomalous Behavior of Synchronizer and Arbiter CircuitsIEEE Transactions on Computers, 1973