Intra-elemental photoelectron line intensities and their significance to quantitative analysis
- 31 March 1976
- journal article
- Published by Elsevier in Analytica Chimica Acta
- Vol. 82 (1), 121-135
- https://doi.org/10.1016/s0003-2670(01)82210-8
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Elemental sensitivities of metals in x-ray photoelectron spectroscopyAnalytical Chemistry, 1975
- Relative photoelectron signal intensities obtained with a magnesium x-ray sourceAnalytical Chemistry, 1975
- The application of electron spectroscopy to surface studiesJournal of Vacuum Science and Technology, 1974
- Application of ESCA to analytical chemistry I. Electrochemical concentration of metals for trace quantitative analysis by ESCAJournal of Electron Spectroscopy and Related Phenomena, 1974
- Electron spectroscopy (ESCA). Use for trace analysisAnalytical Chemistry, 1973
- Trace element determination with semiconductor detector x-ray spectrometersAnalytical Chemistry, 1973
- Analogies between quantitative X‐ray fluorescence analysis (XRFA) and quantitative X‐ray photoelectron spectrometry (XPS)X-Ray Spectrometry, 1973
- Sensitivity of detection of the elements by photoelectron spectrometryAnalytical Chemistry, 1972