Low frequency noise in MOS transistors—II Experiments
- 30 September 1968
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 11 (9), 813-820
- https://doi.org/10.1016/0038-1101(68)90101-9
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Low frequency noise in MOS transistors—I TheorySolid-State Electronics, 1968
- Low frequency noise in MOS field effect transistorsSolid-State Electronics, 1967
- The effects of oxide traps on the MOS capacitanceIEEE Transactions on Electron Devices, 1965
- Limitations of the MOS capacitance method for the determination of semiconductor surface propertiesIEEE Transactions on Electron Devices, 1965
- Lateral AC current flow model for metal-insulator-semiconductor capacitorsIEEE Transactions on Electron Devices, 1965
- Investigation of thermally oxidised silicon surfaces using metal-oxide-semiconductor structuresSolid-State Electronics, 1965