On the Van der Pauw method of resistivity measurements
- 1 March 1994
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 239 (2), 272-275
- https://doi.org/10.1016/0040-6090(94)90863-x
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
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- Dependence of transport parameters on thickness in polycrystalline CdS thin filmsThin Solid Films, 1985
- Electrical properties of polycrystalline In-doped CdS thin filmsJournal of Physics D: Applied Physics, 1984