The surface photo‐oxidation of polystyrene. Part II: The application of ToF‐SIMS to monitor changes in the surface chemistry of neat polystyrene films
- 15 September 1992
- journal article
- Published by Wiley in Surface and Interface Analysis
- Vol. 18 (9), 667-672
- https://doi.org/10.1002/sia.740180906
Abstract
No abstract availableKeywords
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