Scanning tip microwave near-field microscope

Abstract
A near‐field microscope which operates in the rf/microwave frequency range is described. In this microscope, a scanning tunneling microscope (STM)‐like tip rather than an aperture is used as a point‐like evanescent field emitter. A spatial resolution of ∼5 μm (∼λ/100 000) is achieved in the current version. The design of the microscope as well as the principal factors which affect its performance are discussed.