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Origin of modulated interference effects in photoelastic modulators
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Origin of modulated interference effects in photoelastic modulators
Origin of modulated interference effects in photoelastic modulators
EP
Ernst Polnau
Ernst Polnau
HL
Hans Lochbihler
Hans Lochbihler
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1 November 1996
journal article
Published by
SPIE-Intl Soc Optical Eng
in
Optical Engineering
Vol. 35
(11)
,
3331
https://doi.org/10.1117/1.601073
Abstract
Photoelastic modulators (PEMs) consisting of a plane‐parallel dielectric plate exhibit multiple internal reflections like those in a Fabry‐Perot interferometer. If a PEM is illuminated by a coherent radiation source at normal incidence, a modulation of the intensity of transmitted light can be observed. In a recent paper by Oakberg, the modulated interference effect was interpreted as periodic thickness variations of the PEM plate. We discuss three different models that describe interference modulation in PEMs. Then, it is experimentally demonstrated for a PEM with a symmetric optical element that the periodic variation of the refractive index in the PEM plate is responsible for this modulated interference effect. ©
1996 Society of Photo−Optical Instrumentation Engineers.
Keywords
REFRACTIVE INDEX
FABRY PEROT INTERFEROMETER
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Cited by 6 articles