High-frequency circuit characterization using the AFM as a reactive near-field probe
- 31 July 1992
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 42-44, 321-328
- https://doi.org/10.1016/0304-3991(92)90286-s
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- A non-contacting probe for measurements on high-frequency planar circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- High resolution atomic force microscopy potentiometryJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1991
- Electro-optic sampling of high-speed devices and integrated circuitsIBM Journal of Research and Development, 1990
- Sensitivity of direct electro-optic sampling to adjacent signal linesApplied Physics Letters, 1989
- Deposition and imaging of localized charge on insulator surfaces using a force microscopeApplied Physics Letters, 1988
- Noncontact high-speed waveform measurements with the picosecond photoelectron scanning electron microscopeIEEE Journal of Quantum Electronics, 1988
- Scanning tunneling potentiometryApplied Physics Letters, 1986