Charge-exchange neutral-atom filling of ion diodes: Its effect on diode performance and A-K shorting

Abstract

We present a model, supported by experimental evidence, showing how high‐density charge‐exchange neutral atoms (A‐K) gap. The buildup of the neutral atoms in the A‐K gap and their ionization can cause early A‐K shorting which limits high‐power and/or long‐pulse, ion‐diode operation. Ways to avoid the charge‐exchange phenomena are mentioned. The ability to produce large‐pulsed fluxes of energetic neutrals may have unique applications of its own. For example, high rep‐rate spark gaps could benefit from the reduced gas load of an injected short pulse of high‐density neutral atoms. Also discussed is the possibility of using an ion‐diode geometry to fill a spark‐gap cavity with neutrals and then initiate total volume breakdown by ion‐impact ionization, thereby avoiding inductive electron filaments.