Effect of lead additive on the ferroelectric properties and microstructure of SrxPbyBi2zTa2O9 thin films

Abstract

Ferroelectric thin films of bismuth-containing layered perovskite Sr x Pb y Bi 2z Ta 2 O 9 have been prepared using the metalorganic decomposition method. The effect of both Sr and Pb content on the crystal structure,microstructure, and ferroelectricproperties of Sr x Pb y Bi 2.3 Ta 2 O 9 films was investigated. A maximum remanent polarization of 2P r =19.2 μ C/cm 2 was obtained for the Sr x Pb 0.2 Bi 2.3 Ta 2 O 9 film with 20 mol % Sr-deficient composition as prepared at 800 ° C , which could be the compromising effects of Sr content on both grain growth and second phase formation of BiTaO 4 . The substitution of Pb for Bi is accompanied by the occurrence of oxygen vacancies to compensate the charge balance, which is responsible for grain growth mechanism in Sr 0.8 Pb 0.2 Bi 2.3 Ta 2 O 9 films. Fatigue endurance of Sr 0.8 Bi 2.3 Ta 2 O 9 films becomes problematic after 10 9 cycles with a decrease in remanent polarization to 85% of the original value. This phenomenon was related to electron injection and creation of electron traps due to the occupation of Sr vacancies by Bi cations. It is demonstrated that the fatigue endurance of Sr 0.8 Bi 2.3 Ta 2 O 9 film can be improved by doping with 20 mol % PbO.