Emission of Negative Ions from Metal Surfaces Bombarded by Positive Cesium Ions
- 1 December 1962
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 33 (12), 3523-3525
- https://doi.org/10.1063/1.1702439
Abstract
High yields (>1%) of negative metal ions, usually including clusters of metal atoms and oxides, have been observed from targets of Cu, Ag, Au, Be, Cd, Al, Sn, Ta, W, and Ni bombarded by a beam of positive cesium ions. The increase observed in the negative‐ion yields when an auxiliary beam of neutral cesium was directed at a copper target indicates that the presence of cesium on the target was an important factor in the production of large numbers of negative ions. From targets of aluminum and tin, respectively, the Al2− and Sn2− yields were an order of magnitude greater than the corresponding single‐atom yields.Keywords
This publication has 6 references indexed in Scilit:
- Ions Sputtered from CopperJournal of Applied Physics, 1962
- Secondary Positive Ion Emission from Metal SurfacesJournal of Applied Physics, 1959
- Das elektrische Massenfilter als Massenspektrometer und IsotopentrennerZeitschrift für Physik, 1958
- Sputtering of Surfaces by Positive Ion Beams of Low EnergyJournal of Applied Physics, 1958
- Das elektrische MassenfilterThe European Physical Journal A, 1955
- The formation of negative ions by positive-ion impact on surfacesProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1938