Sensitive photothermal deflection technique for measuring absorption in optically thin media
- 1 September 1980
- journal article
- Published by Optica Publishing Group in Optics Letters
- Vol. 5 (9), 377-379
- https://doi.org/10.1364/ol.5.000377
Abstract
A highly sensitive and simple photothermal scheme for determining optical absorptions in condensed-matter samples is presented. αl values as low as 10−7 and 10−8 were measured for thin films and coatings and for liquids, respectively. A comparison with the thermal lens effect is given, and the experimental factors limiting our sensitivity are discussed.Keywords
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