Determination Of Fields Near A Silver Strip On A Glass Substrate

Abstract

The theory and numerical considerations that are used in the computation of the scattered electromagnetic fields near the surface of a silver strip on a glass substrate are presented. These calculations provide theoretical guidance for the measurement of the width of the strip by means of near-field optical scanning. The dimensions of the strip cross section, e. g. 300 nm by 100 nm, can be a fraction of the wavelength of the incident light, 632.8 nm. The flux 1 nm above the surface shows sharp spikes at the edges of the strip. The features of the fields near such a surface could be used for accurate width measurements up to about 30 nm above the strip. The effects of other variables are also shown in the figures.© (1988) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.