Characterization of MBE grown Si/GexSi1−x strained layer superlattices
- 1 February 1987
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 81 (1-4), 434-439
- https://doi.org/10.1016/0022-0248(87)90429-5
Abstract
No abstract availableThis publication has 11 references indexed in Scilit:
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