Phase conjugate interferometric measurement of thin film parameters
- 15 December 1989
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 28 (24), 5196-5197
- https://doi.org/10.1364/ao.28.005196
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.This publication has 9 references indexed in Scilit:
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