Analysis of Thermal and Shot Noise in Pumped Resistive Diodes
- 1 November 1968
- journal article
- website
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Bell System Technical Journal
- Vol. 47 (9), 1883-1902
- https://doi.org/10.1002/j.1538-7305.1968.tb01095.x
Abstract
This paper discusses certain important aspects of the noise behavior of a pumped resistive diode containing shot and thermal noise sources. The derivation of the following result has a central role in the discussion. It is shown that the noise behavi...Keywords
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