Detection of Foreign Atom Sites by Their X-Ray Fluorescence Scattering
- 7 April 1969
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 22 (14), 703-705
- https://doi.org/10.1103/physrevlett.22.703
Abstract
The position of a solute atom in a lattice can be detected by the nature of its x-ray fluorescence excitation during a diffraction process.Keywords
This publication has 2 references indexed in Scilit:
- Dynamical Diffraction of X Rays by Perfect CrystalsReviews of Modern Physics, 1964
- Effect of Dynamical Diffraction in X-Ray Fluorescence ScatteringPhysical Review B, 1964