Contactless Measurement of Resistivity of Slices of Semiconductor Materials
- 1 March 1967
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 38 (3), 360-367
- https://doi.org/10.1063/1.1720705
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Noncontact Technique for the Local Measurement of Semiconductor ResistivityReview of Scientific Instruments, 1965