Method for the Study of Lattice Inhomogeneities Combining X-Ray Microscopy and Diffraction Analysis

Abstract

An x‐ray diffraction method has been developed which establishes a direct correlation between the spot reflections on the Debye‐Scherrer lines and the lattice regions on the specimen surface giving rise to these reflections. After this correlation has been accomplished an analysis of the spot reflections based on the double diffractometer principle is carried out. The method applied to the study of the substructure of metals and alloys discloses the coexistence of various orders of magnitude of substructural entities. The determination of size, disorientation, and lattice misalignment for the various orders of substructural entities is shown and the nature of the small‐angle boundaries is investigated. The general applicability of the method to various research problems is briefly discussed.