A theoretical analysis of HREM imaging for 〈110〉 tetrahedral semiconductors
- 28 February 1989
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 27 (1), 19-34
- https://doi.org/10.1016/0304-3991(89)90198-8
Abstract
No abstract availableKeywords
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