Die Sekundärelektronen-Ausbeute verschiedener Materialien bei Beschuß mit leichten Ionen hoher Energie / Secondary Electron Yield from Various Materials under the Impact of Light Ions at High Energies

Abstract

The backward emission of secondary electrons from thick targets of graphite, aluminum, copper, molybdenum and tantalum under the impact of protons, deuterons, 3 He-ions and a-particles has been measured for incident energies in the MeV-range. The data are discussed within the scope of theoretical considerations based on low-energy studies taking into account the contribution due to ;< 5-rays.