The uv Absorption Edge of Tin Oxide Thin Films
- 1 August 1967
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 38 (9), 3767-3770
- https://doi.org/10.1063/1.1710208
Abstract
The absorption edge spectrum of thin films of SnO2 has been obtained at room temperature using unpolarized light. The dependence of the absorption coefficient upon film resistivity has been noted and an impurity peak at about 3.4 eV has been observed. The measurements suggest an indirect edge near 2.7 eV and a direct edge near 4.3 eV.Keywords
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- Optical and Electrical Properties of Tin Oxide FilmsJournal of the Physics Society Japan, 1958