Pulsed technique for noise temperature measurement
- 1 April 1974
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 7 (4), 287-290
- https://doi.org/10.1088/0022-3735/7/4/021
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Metal semiconductor contact: Resistivity and noiseSolid-State Electronics, 1973
- Analysis of the thermal noise behaviour in JG FET at low temperaturePhysica, 1971