A New Time-of-Flight Instrument for SIMS and Its Application to Organic Compounds
- 1 January 1984
- book chapter
- Published by Springer Nature
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Fast atom bombardment mass spectrometryAnalytical Chemistry, 1982
- A time-of-flight mass spectrometer for measurement of secondary ion mass spectraInternational Journal of Mass Spectrometry and Ion Physics, 1981
- Secondary ion mass spectrometery: A new analytical technique for biologically important compoundsJournal of Mass Spectrometry, 1977
- Multiple-focusing time-of-flight mass spectrometers Part II. TOFMS with equal energy accelerationInternational Journal of Mass Spectrometry and Ion Physics, 1972