Rippled surface topography observed on silicon molecular beam epitaxial and vapour phase epitaxial layers
- 30 December 1989
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 183 (1-2), 255-262
- https://doi.org/10.1016/0040-6090(89)90450-1
Abstract
No abstract availableThis publication has 15 references indexed in Scilit:
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