In Situ Detection of Surface SiHn in Synchrotron-Radiation-Induced Chemical Vapor Deposition of a-Si on an SiO2 Substrate
- 1 July 1995
- journal article
- research article
- Published by International Union of Crystallography (IUCr) in Journal of Synchrotron Radiation
- Vol. 2 (4), 196-200
- https://doi.org/10.1107/s0909049595006091