Abstract
In the above paper1 Fleishchhammer and Dortok present a measurement system to analyze the metastable state in synchronizer circuits. We present the specific measures which have to be taken in the design for such a system to get intrinsic characterization of circuits. We propose a measurement system based on the introduction of a new parameter of synchronizer circuits allowing an accurate characterization of the considered phenomenom. Some results are given concerning standard flip-flops.