Leakage current in semiconductor junction radiation detectors and its influence on energy-resolution characteristics
- 31 July 1961
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 12, 249-262
- https://doi.org/10.1016/0029-554x(61)90140-9
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Evaluation of the Surface Concentration of Diffused Layers in SiliconBell System Technical Journal, 1958