Low-Frequency Noise in Tin Films at the Superconducting Transition
- 12 May 1975
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 34 (19), 1217-1220
- https://doi.org/10.1103/physrevlett.34.1217
Abstract
The noise spectra of current-biased tin films on glass substrates at the superconducting transition were in quantitative agreement with the semiempirical formula of Clarke and Voss. Tin films with an aluminum underlay to reduce the thermal boundary resistance between film and substrate had spectra that were flat at low frequencies. Spatial correlation of the noise was observed in both types of samples.
Keywords
This publication has 4 references indexed in Scilit:
- Noise from Thermal Fluctuations in Metal FilmsPhysical Review Letters, 1974
- Current-Induced Intermediate State in Thin-Film Type-I Superconductors: Electrical Resistance and NoisePhysical Review B, 1973
- Comparative studies of noise limitations in superconducting thin-film radiation detectorsProceedings of the IEEE, 1973
- 1/ƒ noise is no surface effectPhysics Letters A, 1969