16O contamination in 4He analysis beams
- 1 December 1973
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 19 (2), 371-380
- https://doi.org/10.1016/0040-6090(73)90073-4
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- The combined use of He back-scattering and He-induced X-rays in the study of anodically grown oxide films on GaAsThin Solid Films, 1973
- Comparison of surface layer analysis techniquesThin Solid Films, 1973
- Radiation blistering of polycrystalline niobium by helium-ion implantationJournal of Applied Physics, 1973
- Helium ion stopping cross sections in goldRadiation Effects, 1972
- Semiconductor physics and channelingRadiation Effects, 1972
- Observations on Bayard–Alpert Ion Gauge Sensitivities to Various GasesJournal of Vacuum Science and Technology, 1971