High resolution transmission electron microscopy of interphase interfaces in NiO-ZrO2(CaO)
- 2 May 1989
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 29 (1-4), 60-70
- https://doi.org/10.1016/0304-3991(89)90231-3
Abstract
No abstract availableThis publication has 12 references indexed in Scilit:
- Overview no. 61 On geometric criteria for low interfacial energyActa Metallurgica, 1987
- A consistent definition of probe size and spatial resolution in the analytical electron microscopeJournal of Microscopy, 1987
- Evolution of the Nickel /Zirconia InterfacePublished by Wiley ,1986
- The growth of spinel into AI2O3Philosophical Magazine A, 1985
- Directional solidification in the NiO-ZrO2 systemJournal of Crystal Growth, 1984
- BicrystallographyProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1983
- Computer simulation of ?01l? tilt grain boundaries in nickel oxidePhilosophical Magazine A, 1983
- Eutectic Solidification in Ceramic SystemsAnnual Review of Materials Science, 1981
- The effects on grain-boundary processes of the steps in the boundary plane associated with the cores of grain-boundary dislocationsActa Crystallographica Section A, 1980
- The surface properties of uranium dioxideSurface Science, 1979