A secondary electron emission correction for quantitative auger yield measurements
- 2 November 1980
- journal article
- Published by Elsevier BV in Surface Science
- Vol. 100 (3), 529-540
- https://doi.org/10.1016/0039-6028(80)90420-3
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
- Linearized secondary-electron cascades from the surface of metals. III. Line-shape synthesisPhysical Review B, 1979
- andAuger spectra of copperPhysical Review B, 1978
- Linearized secondary-electron cascades from the surfaces of metals. I. Clean surfaces of homogeneous specimensPhysical Review B, 1977
- Linearized secondary-electron cascades from the surfaces of metals. II. Surface and subsurface sourcesPhysical Review B, 1977
- Auger spectra of Cu, Zn, Ga, and Ge. I. Transition probabilities, term splittings, and effective Coulomb interactionPhysical Review B, 1977
- Surface characterization by Auger electron spectrometryJournal of Vacuum Science and Technology, 1974
- High-Resolution X-Ray Photoemission Spectrum of the Valence Bands of GoldPhysical Review B, 1972
- Deconvolution techniques in Auger electron spectroscopySurface Science, 1971
- Band structure of silicon by characteristic auger electron spectrum analysisSurface Science, 1970
- Resolution and Sensitivity Considerations of an Auger Electron Spectrometer Based on Display LEED OpticsReview of Scientific Instruments, 1969