Two-color approach for determination of thickness and dielectric constant of thin films using surface plasmon resonance spectroscopy
- 1 October 1996
- journal article
- Published by Elsevier in Optics Communications
- Vol. 130 (4-6), 260-266
- https://doi.org/10.1016/0030-4018(96)00238-6
Abstract
No abstract availableKeywords
This publication has 13 references indexed in Scilit:
- Antibody Binding to Antigen-Coated Substrates Studied with Surface Plasmon OscillationsLangmuir, 1995
- X-ray and Ellipsometric Studies of Self-Assembled Monolayers of Fluorinated ChlorosilanesLangmuir, 1994
- Kinetics of carboxylic acid surface displacement reactions: a coupled surface plasmon and surface Raman scattering investigationLangmuir, 1991
- Biotin-functionalized self-assembled monolayers on gold: surface plasmon optical studies of specific recognition reactionsLangmuir, 1991
- Determination of thickness and dielectric constant of thin transparent dielectric layers using surface plasmon resonanceOptics Communications, 1991
- The structure of self-assembled monolayers of alkylsiloxanes on silicon: a comparison of results from ellipsometry and low-angle x-ray reflectivityJournal of the American Chemical Society, 1989
- Molecular monolayers and films. A panel report for the Materials Sciences Division of the Department of EnergyLangmuir, 1987
- Surface plasma oscillations at silver surfaces with thin transparent and absorbing coatingsSurface Science, 1978
- The effect of thin organic films on the surface plasma resonance on goldOptics Communications, 1977
- Notizen: Radiative Decay of Non Radiative Surface Plasmons Excited by LightZeitschrift für Naturforschung A, 1968