The Use of Defect Correction to Refine the Eigenelements of Compact Integral Operators
- 1 December 1983
- journal article
- Published by Society for Industrial & Applied Mathematics (SIAM) in SIAM Journal on Numerical Analysis
- Vol. 20 (6), 1087-1093
- https://doi.org/10.1137/0720077
Abstract
No abstract availableKeywords
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