Quantum efficiency of a silicon gate charge-coupled optical imaging array
- 16 December 1973
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 20 (2), 675-685
- https://doi.org/10.1002/pssa.2210200230
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Reverse-bias characteristics of a P+-N-N+ photodiodeSolid-State Electronics, 1972
- Nondestructive Thickness Determination of Polycrystalline Silicon Deposited on Oxidized SiliconJournal of the Electrochemical Society, 1972
- Charge-coupled imaging devices: Design considerationsIEEE Transactions on Electron Devices, 1971
- CHARGE COUPLED 8-BIT SHIFT REGISTERApplied Physics Letters, 1970
- Charge Coupled Semiconductor DevicesBell System Technical Journal, 1970