Ballistic electron emission microscopy studies of the NiSi2/Si(111) interface

Publisher Website

1 March 1991

journal article
Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Vol. 9 (2), 590-593
https://doi.org/10.1116/1.585465

Abstract

No abstract available

Keywords

Cited by 12 articles