Time domain characterization of thin film head/media systems
- 1 January 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 24 (6), 2949-2954
- https://doi.org/10.1109/20.92298
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- A study of disk noise statisticsIEEE Transactions on Magnetics, 1986
- An experimental study of signal equalization for thin film headsIEEE Transactions on Magnetics, 1986
- Measurement of noise in magnetic mediaIEEE Transactions on Magnetics, 1983
- Design and peak shift characterization of magnetoresistive head thin film media systemIEEE Transactions on Magnetics, 1983
- A margin analyser for disk and tape drivesIEEE Transactions on Magnetics, 1981
- Effect of bitshift distribution on error rate in magnetic recordingIEEE Transactions on Magnetics, 1979