Topographic Information from Multiple Beam Interferometry in the Surface Forces Apparatus
- 1 July 1997
- journal article
- Published by American Chemical Society (ACS) in Langmuir
- Vol. 13 (14), 3839-3848
- https://doi.org/10.1021/la960942a
Abstract
No abstract availableKeywords
This publication has 17 references indexed in Scilit:
- Computer-Controlled Experiments in the Surface Forces Apparatus with a CCD-SpectrographLangmuir, 1996
- Eigenvalue analysis of the surface forces apparatus interferometerJournal of the Optical Society of America A, 1995
- Experimental phase changes at the mica–silver interface illustrate the experimental accuracy of the central film thickness in a symmetrical three-layer interferometerApplied Optics, 1995
- Enhanced Absorption within a Cavity. A Study of Thin Dye Layers with the Surface Forces ApparatusThe Journal of Physical Chemistry, 1994
- Extended Spectral Analysis of Multiple Beam Interferometry: A Technique To Study Metallic Films in the Surface Forces ApparatusLangmuir, 1994
- Analytic solution for the three-layer multiple beam interferometerApplied Optics, 1991
- Surface Forces and Their Action in Ceramic MaterialsJournal of the American Ceramic Society, 1990
- Multiple-beam interferometry with thin metal films and unsymmetrical systemsJournal of Physics D: Applied Physics, 1989
- Direct measurement of long range forces between two mica surfaces in aqueous KNO3 solutionsNature, 1976
- Evidence for a Chemical Discontinuity near the Basalt–Andesite Transition in Many Anorogenic Volcanic SuitesNature, 1972