Interference Method for Measuring the Thickness of Epitaxially Grown Films
- 1 April 1961
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 32 (4), 744-745
- https://doi.org/10.1063/1.1736089
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- CorrespondenceProceedings of the IRE, 1960
- Determination of Optical Constants and Carrier Effective Mass of SemiconductorsPhysical Review B, 1957