Electron microscopy of plasmons
- 1 July 1974
- journal article
- research article
- Published by Taylor & Francis in Philosophical Magazine
- Vol. 30 (1), 135-143
- https://doi.org/10.1080/14786439808206540
Abstract
When tilted illumination is used, the transform intensity of a defocus, phase- contrast micrograph is modulated by intensity maxima whose loci describe circles displaced from the transform origin. δE, the excitation energy of a single plasmon, can be accurately determined by simply measuring the radii of these circles. Results are presented for C, Cu, Si and WS2.Keywords
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