Precision absolute thin film standard reference targets for nuclear reaction microanalysis of oxygen isotopes: Part II: 18O and 17O standards
- 1 March 1978
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 149 (1-3), 713-720
- https://doi.org/10.1016/0029-554x(78)90957-6
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- Preparation of isotopic oxygen targets via the anodic oxidation of tantalumNuclear Instruments and Methods, 1976
- Investigation of the Passivity of Iron by Nuclear Microanalysis Using Stable Oxygen IsotopesJournal of the Electrochemical Society, 1973
- A Very Precise Sectioning Method for Measuring Concentration Profiles in Anodic Tantalum OxideJournal of the Electrochemical Society, 1972
- Microanalysis by the direct observation of nuclear reactions using a 2 MeV Van de GraaffNuclear Instruments and Methods, 1971
- The use of the nuclear microanalysis of light elements in electrochemistry applications to anodic oxidation processes by direct determination of 16O and by 18O tracingCollection of Czechoslovak Chemical Communications, 1971
- A Study of the Oxygen Growth Laws of Anodic Oxide Films on Aluminum and Tantalum Using Nuclear Microanalysis of O16 and O18Journal of the Electrochemical Society, 1971
- Transferts ioniques durant l'oxydation anodique d'un hydroxyde de nickelElectrochimica Acta, 1969
- Microanalysis of the stable isotopes of oxygen by means of nuclear reactionsAnalytical Chemistry, 1967
- Spectroscopie par détecteurs à semiconducteur des réactions nucléaires O16 + d, O18 + pAnnales de Physique, 1964