Reliability bounds and critical time for the Birnbaum-Saunders distribution
- 1 January 1993
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Reliability
- Vol. 42 (3), 464-469
- https://doi.org/10.1109/24.257832
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
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