Contrast Enhancement of the Transverse Kerr Effect

Abstract

It is shown theoretically that the transverse Kerr effect can be enhanced in a similar manner to the longitudinal Kerr effect by applying a suitable dielectric to the surface of the magnetic medium. The parameters of the dielectric (thickness and refractive index) for optimum contrast must be adjusted to meet the usual antireflection conditions. These conclusions are substantiated by measurements on dielectrically enhanced thin evaporated molypermalloy films. The contrast, measured by the relative change in reflectivity, Δr/r, is enhanced by a factor of about 15. The same sample demonstrates a 20‐fold enhancement in the longitudinal Kerr rotation (going from 6 min to 2 deg).