The IBM computer-stem system
- 31 December 1982
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 8 (3), 293-300
- https://doi.org/10.1016/0304-3991(82)90246-7
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Digital data acquisition of electron energy loss intensitiesUltramicroscopy, 1978
- Slow Scan Display System for a Scanning Electron MicroscopeReview of Scientific Instruments, 1973
- A Scanning Electron Diffraction Study of Vapor‐Deposited and Ion Implanted Thin Films of Ge (I)Physica Status Solidi (b), 1973