Observation of Luminescence from a Highly Concentrated Nd Center in GaP by Direct Optical Excitation and Comparison with Nd Centers Excited Under Host Excitation
- 1 December 1991
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 30 (12S), 3788-3791
- https://doi.org/10.1143/jjap.30.3788
Abstract
We report the studies of direct excitation on Nd-doped GaP samples grown by metalorganic chemical vapor deposition. It is found that extremely sharp photoluminescence excitation lines, with full width at half maximum of less than 0.02 nm at 4 K, can be observed when the excitation photon energy is in resonance with the Nd internal 4f-shell transition energy. We used direct excitation spectra to estimate the concentration of each individual Nd luminescence center, and found that the majority of the Nd ions form one particular kind of noncubic center which cannot be effectively excited through energy transfer from the host crystal. Such a phenomenon is likely to be the reason why the efficiencies of the rare-earth-doped III-V compounds are low. It also suggests that if we can fully utilize all the available rare-earth ions, a much higher efficiency can be achieved.Keywords
This publication has 6 references indexed in Scilit:
- Luminescence intensity and lifetime dependences on temperature for Nd-doped GaP and GaAsApplied Physics Letters, 1991
- Optical and electrical properties of ytterbium-doped GaAs grown by metalorganic chemical vapor depositionJournal of Applied Physics, 1990
- Electrical properties of ytterbium-doped InP grown by metalorganic chemical vapor depositionApplied Physics Letters, 1988
- Erbium-doped GaAs light-emitting diodes emitting erbium f-shell luminescence at 1.54 [micro sign]mElectronics Letters, 1988
- Photoluminescence optimization and characteristics of the rare-earth element erbium implanted in GaAs, InP, and GaPJournal of Applied Physics, 1986
- Ytterbium-doped InP light-emitting diode at 1.0 μmApplied Physics Letters, 1985