A novel structural singularity in vacuum-deposited thin films: The mechanism of critical optimization of thin film properties
- 1 August 1981
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 82 (4), 357-376
- https://doi.org/10.1016/0040-6090(81)90479-x
Abstract
No abstract availableThis publication has 17 references indexed in Scilit:
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