Microstructural characterization of Y-PSZ (4 mol%) polycrystals by means of X-ray diffraction experiments
- 31 October 1992
- journal article
- Published by Elsevier in Materials Letters
- Vol. 15 (1-2), 39-44
- https://doi.org/10.1016/0167-577x(92)90009-9
Abstract
No abstract availableKeywords
This publication has 21 references indexed in Scilit:
- Neutron Diffraction Studies of Phase Transformations between Tetragonal and Orthorhombic Zirconia in Magnesia‐Partially‐Stabilized ZirconiaJournal of the American Ceramic Society, 1990
- ‘Polymorph Method’ Determination of Monoclinic Zirconia in Partially Stabilized Zirconia CeramicsJournal of the American Ceramic Society, 1990
- Measurement of Phase Abundance in Magnesia‐Partially‐Stabilized Zirconia by Rietveld Analysis of X‐ray Diffraction DataJournal of the American Ceramic Society, 1990
- Spatially Resolved Raman Spectroscopy Study of Transformed Zones in Magnesia‐Partially‐Stabilized ZirconiaJournal of the American Ceramic Society, 1989
- Quantitative Analysis of Polymorphic Mixes of Zirconia by X‐ray DiffractionJournal of the American Ceramic Society, 1987
- Profile shape functions in Rietveld refinementsJournal of Applied Crystallography, 1982
- REVIEW—Transformation Toughening in Ceramics: Martensitic Transformations in Crack‐Tip Stress FieldsJournal of the American Ceramic Society, 1980
- Microstructural Development in MgO‐Partially Stabilized Zirconia (Mg‐PSZ)Journal of the American Ceramic Society, 1979
- Ceramic steel?Nature, 1975
- A profile refinement method for nuclear and magnetic structuresJournal of Applied Crystallography, 1969